Tektronix DSA8300 USED FOR SALE

With intrinsic jitter of less than 100 femtoseconds for extremely accurate device characterization, the DSA8300 Series provides comprehensive support for Optical Communications Standards, Time Domain Reflectometry and S-parameters. The DSA8300 Digital Sampling Oscilloscope is a complete high-speed PHY Layer testing platform for data communications from 155 Mb/sec to 400G PAM4.

Product Highlights

• Optical modules
• Optical modules that support optical data rates from 155 Mb/s to 10 Gb/s to 40 Gb/s to 100 Gb/s to PAM4 for 50G/100G/200G/400G
• Optical reference receivers (ORR) 1 support specified requirements for standards-mandated compliance testing beyond 56 GBd (PAM4 and PAM2 NRZ)(80C10C)
• High optical sensitivity, low noise, and wide dynamic range of the optical sampling modules allows accurate testing and characterization of short-reach to long-haul optical communications standards
• Fully calibrated clock recovery solutions – no need to manually calibrate for data pick-off losses
• Calibrated extinction ratio measurements and variable correction ER measurement ensure accuracy and repeatability
• Electrical modules
• Very low-noise electrical samplers (280 μV at 20 GHz, 450 μV at 60 GHz, typical)
• Selectable bandwidths 2 allow the user to trade-off sampler bandwidth and noise for optimal data acquisition performance
• Remote samplers 3 or compact sampling extender module cables minimize signal degradation by allowing the sampler to be located in close proximity to the device under test
• High-performance integrated TDR (10 ps typical step rise time) supports exceptional impedance discontinuity characterization and high dynamic range for S-parameter measurements to 50 GHz
• Analysis
• Jitter, noise, and BER analysis of high-speed PAM4 and PAM2 NRZ serial data rates from
• Analysis of PAM4 signals with comprehensive jitter, noise and BER analysis for each individual PAM eye, and a set of global measurements that assess the overall PAM4 signal attributes
• 100G-SR4/Transmitter and Dispersion Eye Closure (TDEC) automation provides turn-key testing and debug of TX Optical properties key to the SR4 Short Reach Ethernet
• 80STDEC streamlines high performance Transmitter and Dispersion Eye Closure (TDEC) measurement making it ideal for manufacturing and conformance validation applications
• Automated mask testing with over 80 industry-standard masks. New masks can be imported into the DSA8300 to support new emerging standards. Users can define their own masks for automated mask testing
• Jitter, noise, BER, mask testing, and Serial Data Link Analysis (SDLA) are provided through the 80SJNB Essentials and Advanced Software Application Options
• Advanced TDR analysis, S-parameter measurements, simulation model extraction, and serial link simulation capabilities are provided by the IConnect® Software Application options
• High test throughput
• High sample acquisition rate up to 200 kS/s per channel
• Efficient programmatic interface (IEEE-488, Ethernet, or local processor access) enables high test throughput