Used Tektronix DSA8300 Digital Sampling Analyser Oscilloscope, 8 Channel
Digital Sampling Analyser Oscilloscope, 8 Channel

Order #: DSA8300-USED

Mfg #: DSA8300

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(800) 633-0561
$39,999.00

Used Tektronix DSA8300 Digital Sampling Analyser Oscilloscope, 8 Channel

Digital Sampling Analyser Oscilloscope, 8 Channel

Order #: DSA8300-USED

Mfg #: DSA8300

$39,999.00

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With intrinsic jitter of less than 100 femtoseconds for extremely accurate device characterization, the DSA8300 Series provides comprehensive support for Optical Communications Standards, Time Domain Reflectometry and S-parameters. The DSA8300 Digital Sampling Oscilloscope is a complete high-speed PHY Layer testing platform for data communications from 155 Mb/sec to 400G PAM4.

Product Highlights

  • Optical modules
    • Optical modules that support optical data rates from 155 Mb/s to 10 Gb/s to 40 Gb/s to 100 Gb/s to PAM4 for 50G/100G/200G/400G
    • Optical reference receivers (ORR) 1 support specified requirements for standards-mandated compliance testing beyond 56 GBd (PAM4 and PAM2 NRZ)(80C10C)
    • High optical sensitivity, low noise, and wide dynamic range of the optical sampling modules allows accurate testing and characterization of short-reach to long-haul optical communications standards
    • Fully calibrated clock recovery solutions – no need to manually calibrate for data pick-off losses
    • Calibrated extinction ratio measurements and variable correction ER measurement ensure accuracy and repeatability
  • Electrical modules
    • Very low-noise electrical samplers (280 μV at 20 GHz, 450 μV at 60 GHz, typical)
    • Selectable bandwidths 2 allow the user to trade-off sampler bandwidth and noise for optimal data acquisition performance
    • Remote samplers 3 or compact sampling extender module cables minimize signal degradation by allowing the sampler to be located in close proximity to the device under test
    • High-performance integrated TDR (10 ps typical step rise time) supports exceptional impedance discontinuity characterization and high dynamic range for S-parameter measurements to 50 GHz
  • Analysis
    • Jitter, noise, and BER analysis of high-speed PAM4 and PAM2 NRZ serial data rates from
    • Analysis of PAM4 signals with comprehensive jitter, noise and BER analysis for each individual PAM eye, and a set of global measurements that assess the overall PAM4 signal attributes
    • 100G-SR4/Transmitter and Dispersion Eye Closure (TDEC) automation provides turn-key testing and debug of TX Optical properties key to the SR4 Short Reach Ethernet
    • 80STDEC streamlines high performance Transmitter and Dispersion Eye Closure (TDEC) measurement making it ideal for manufacturing and conformance validation applications
    • Automated mask testing with over 80 industry-standard masks. New masks can be imported into the DSA8300 to support new emerging standards. Users can define their own masks for automated mask testing
    • Jitter, noise, BER, mask testing, and Serial Data Link Analysis (SDLA) are provided through the 80SJNB Essentials and Advanced Software Application Options
    • Advanced TDR analysis, S-parameter measurements, simulation model extraction, and serial link simulation capabilities are provided by the IConnect® Software Application options
  • High test throughput
    • High sample acquisition rate up to 200 kS/s per channel
    • Efficient programmatic interface (IEEE-488, Ethernet, or local processor access) enables high test throughput
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