Used Tektronix PPG3204 Programmable Pattern Generator, 4 Channel, 32Gb/s

Product Highlights

The Tektronix PatternPro line of high-performance pattern generators offer single and multi-channel configurations capable of data rates up to 32 Gb/s. With optional jitter insertion, the PPG line offers a flexible, cost effective and easy to use test solution supporting high speed applications such as 100 Gigabit Ethernet, 32G Fibre channel, PAM4, DP-QPSK testing, and a broad range of receiver test applications. The single unit multi-channel configurations provide aligned, pattern-independent data outputs that support testing of crosstalk immunity and multi-channel functionality. The PPG line can be paired with the Tektronix PED line of Error Detector products to provide a complete BER test capability.

Key performance specifications

• Low inherent jitter (typical RJ <250 fs)
• 11 ps typical 20% to 80% rise/fall times
• Variable output amplitude:
  • 300 mV to 1.0 V for PPG3200
  • 250 mV to 2.0 V for PPG1600 and PPG3000 series
• Low frequency, high amplitude jitter insertion range of 10 Hz to 10 MHz at up to 5000 UI (PPG3200 series with Option LFJIT)
• BUJ amplitudes up to 50 ps_p-p with modulation rates up to 2.5 Gb/s (with Option HFJIT)
• 35% to 65% programmable crossing point (PPG1600 & PPG3000 series)

Key features

• Available with 1, 2, or 4 output channels of 16, 30, or 32 Gb/s (independent data on all channels)
• Provides full end-to-end multi-channel BER test solution when paired with the PED series error detector
• Jitter insertion options include BUJ, SJ, RJ, and PJ
• Aligned data on multi-channel units
• Full rate built-in adjustable clock source
• DC coupled differential data outputs
• Programmable output amplitude, offset, and crossing point
• PRBS and user defined patterns
• Adjustable channel phase delay
• Front panel touch screen GUI or USB computer control

Applications

• Multi-channel 25 Gb/s testing for 100 G Ethernet
• DQPSK and DP-QPSK testing
• CFP2 and CFP4 testing
• Multi-level signal testing
• Semiconductor and component testing