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Overview
Uncompromised Bandwidth: Up to 33 GHz and rise time as fast as 9 ps on all 4 channels enables measurement on the latest high-speed serial standards
Industry-leading Sample Rate and Timing Resolution: 100 GS/s on 2 Channels (33, 25, 20, 16, and 12.5 GHz models)
On All Four Channels Simultaneously: 33, 25, 20, 16, 12.5, 8, 6, and 4 GHz Bandwidth Models, Up to 50 GS/s Real-time Sample Rate Up to 250 Megasample Record Length with MultiView Zoom Feature for Quick Navigation, Fastest Waveform Capture Rate with >300,000 wfms/s Maximum per Channel
Superior Signal Integrity and Excellent Signal-to-Noise Ratio - Observe the truest representation of your waveform
16 Logic Channels with 80 ps Timing Resolution for Debug of Digital and Analog Signals (MSO70000 Series only)
Pinpoint Triggering - Minimize time spent trying to acquire problem signals for efficient troubleshooting and shortened debug time
Visual Trigger – Precisely qualify triggers and find unique events in complex waveforms
6.25 Gb/s Real-time Serial Trigger - Assures triggering on the first instance of a specified NRZ or 8b/10b pattern to allow isolation of pattern-dependent effects
Search & Mark - Provides waveform or serial bus pattern matching and software triggers for signals of interest
Automated Serial Triggering and Decode Options for 8b10b Encoded Serial Data, I2C, SPI, RS-232/422/485/UART, USB 2.0, and MIPI D-PHY
P7500 TriModeâ„¢Probing System - Perfectly matched signal connectivity
Application Support for High-speed Serial Industry Standards, wideband RF, Power Supplies, and Memory - Enables standard-specific certification, measurement automation, and ease of use
P6780, P6750, and P6717A High-performance 17-channel Logic Probes with Bandwidths up to 2.5 GHz for Connections to Today's Fast Digital Signals (MSO70000 Series only)
Applications
Design Verification including Signal Integrity, Jitter, and Timing Analysis
Design Characterization for High-speed, Sophisticated Designs
Certification Testing of Serial Data Streams for Industry Standards
Memory Bus Analysis and Debug
Prototype Turn-on and Power Supply Verification
Research and Investigation of Transient Phenomena
Production Testing of Complex Systems
Spectral Analysis of Transient or Wide-bandwidth RF Signals