Product Highlights
Simplifies identifying signal integrity concerns, jitter and their related sources and provides the highest sensitivity and accuracy available for real-time oscilloscopes.
Based on the industry-standard Tektronix DPOJET eye-diagram, jitter, noise, and timing analysis package, the Advanced Jitter and Eye Diagram Analysis option provides the highest sensitivity and accuracy available in real-time instruments. Unlike competitive jitter analysis applications, this application integrates the comprehensive jitter and eye-diagram analysis into the oscilloscope's automatic measurement system user interface. The automatic measurements, measurement plots, and advanced jitter decomposition algorithms simplify discovering signal integrity concerns and jitter and their related sources in today's high-speed serial, digital, and communication system designs.
Key standard measurement features
- Basic timing parametric measurements such as period, frequency, rise/fall times, pulse width, and duty cycle
- Time Interval Error (TIE)
- Phase Noise
- Many graphical tools such as Histograms, Time Trends, and Spectrums
- Programmable software clock recovery including software PLL 1
- Selectable high- and low-limit measurement bounds
Key optional Jitter Analysis features
- Jitter and Timing Analysis for analog and digital clock and data signals
- Real-time Eye-diagram Analysis 1
- Automatic bit rate and pattern length detection eases measurement configuration
- Selectable high- and low-pass measurement filters
- Multiple plot types to view and analyze jitter: Time Trend, Eye Diagram, Histogram, Spectrum, Bathtub Curve, and SSC Profile
- Accurate jitter analysis using the spectral and Q-scale methods for detailed decomposition of jitter components, including the extraction of industry-standard dual-Dirac model parameters
- Jitter separation algorithms accurately measure the effects of bounded uncorrelated jitter (BUJ) which enables precise TJ measurements
- Eye diagram mask testing
Applications
- Quantify signal amplitude and timing parameters and margins
- Debug complex embedded systems
- Characterize performance of high-speed serial and parallel bus designs
- Characterize clock and data jitter/noise and signal integrity
- Characterize PLL dynamic performance
- Characterize modulation of spread spectrum clock circuits
- Characterize jitter generation, transfer, and tolerance
The Advanced Jitter and Eye-diagram Analysis tools extend the capability of Tektronix real-time oscilloscopes, performing complex measurements and analysis of clock, serial, and parallel data signals captured in continuous or single-shot acquisition modes. The jitter and eye-diagram analysis measurements can be made on any of the analog FlexChannel® inputs, any active math waveforms, or any active reference waveforms.
Advanced Jitter and Eye-diagram Analysis is integrated into the oscilloscope's automatic measurement system, allowing essentially unlimited combinations of standard and jitter measurements to be enabled and displayed. Within the Add New Measure configuration menu, the standard amplitude and timing measurements are on the Standard tab and the jitter measurements are on the Jitter tab.