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Overview
Product Highlights
The Best SMU Solution for a Broad Range of IV Measurements
SMUs are popular and widespread instruments for performing IV measurements in many different fields and applications due to their integrated voltage and current sourcing and measurement capabilities. The B2900B/BL Series SMU provides superior performance and usability at a very reasonable price. In addition, the B2900B/BL Series SMU supports many functions to speed up production test and increase throughput. The versatile measurement capabilities of the B2900B/BL Series SMU make it an ideal choice for a variety of IV measurements such as semiconductor test, active/passive component test and general electronic device and material characterization. The B2900B/BL Series SMU has a broad application range that spans uses from R&D and education to industrial development, production test and automated manufacturing. Moreover, they work equally well as either standalone or system components.
A revolutionary source/measure solution with easy-to-use GUI
Innovative GUI: I-V (current - voltage) measurement without PC programming
High sourcing & measurement resolution: 10 fA/100 nV
Wide application coverage: 210 V, 3 A DC/10.5 A pulsed
Minimum digitizing interval: 10 µsec
Multiple software control options, allowing you to choose the solution that best fits your particular application
Typical applications
Optical devices (laser diodes, photo diodes)
Organic devices (OLEDs)
Photovoltaic (solar) cells
Nano-technology materials
Power management devices (LDOs)
Semiconductor devices (FETs, transistors)
Resistors, diodes, varistors, and other component devices
Testing semiconductors, discrete and passive components
Diodes, laser diodes, LEDs
Photodetectors, sensors
Field effect transistors (FETs), bipolar junction transistors (BJTs)
ICs (analog ICs, RFICs, MMICs, etc)
Resistor, varistor, thermistors, switches
Testing precision electronics and green energy devices
Photovoltaic cells
Power transistors, power devices
Battery
Automotive
Medical instruments
Power and DC bias source for circuit test
Research and education
New material investigations
Nano devices characterization (e.g. CNT)
Giant magnetic resistance (GMR)
Organic devices
Any precise voltage/current source and measurement
