Keysight / Agilent B1525A USED FOR SALE
High Voltage Semiconductor Pulse Generator Unit (HV-SPGU)

Order #: B1525A-USED

Mfg #: B1525A-USED

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(800) 633-0561
$12,999.00

Keysight / Agilent B1525A USED FOR SALE

High Voltage Semiconductor Pulse Generator Unit (HV-SPGU)

Order #: B1525A-USED

Mfg #: B1525A-USED

$12,999.00

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Availability:
In stock
This product is available for shipping to the United States, Canada, and Puerto Rico only.
This product is available for shipping to the United States, Canada, and Puerto Rico only.
This product is available for shipping to the United States, Canada, and Puerto Rico only.

Product Highlights

The Keysight B1525A High Voltage Semiconductor Pulse Generator Unit is a plug-in module for the B1500A semiconductor device analyzer that provides a 5 microsecond pulsed IV parametric test solution with up to 40 V and 400 mA output capability. It is the best choice for pulsed IV parametric measurement for middle range power devices, such as GaAs and HEMT devices for RF applications. The High Voltage Semiconductor Pulse Generator Unit module has an output-voltage monitor capability that supports a 5 ?s sampling interval, providing superb accuracy. As shown in the block diagram this feature enables the calculation of the output current using the known output impedance of the High Voltage Semiconductor Pulse Generator Unit module.

The features in the B1525A High Voltage Semiconductor Pulse Generator Unit module, the highest accurate voltage forcing among the pulse generators for semiconductor test, arbitrary waveform generation with 10 ns setting resolution, offer best-in-class pulse generation to meet wider application coverage. Each High Voltage Semiconductor Pulse Generator Unit module has two channels, so only one module is necessary for three-terminal device evaluation. This solution does not require any other external equipment or complex cabling. EasyEXPERT supplies a library of application tests for performing pulsed IV measurement using HVSPGU. The most basic of these application tests permits you to specify single (spot) pulsed measurement on two High Voltage Semiconductor Pulse Generator Unit channels.

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