Keysight / Agilent 41421B USED FOR SALE
Source/Monitor Unit SMU Module '+/-100microV - +/-100V, +/-50f

Order #: 41421B-USED

Mfg #: 41421B-USED

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(800) 633-0561
$1,499.00

Keysight / Agilent 41421B USED FOR SALE

Source/Monitor Unit SMU Module '+/-100microV - +/-100V, +/-50f

Order #: 41421B-USED

Mfg #: 41421B-USED

$1,499.00

Used instruments from TranscatTranscat is a Premier Supplier Used Test and Measurement Equipment. Many options are available for a variety of instruments. Contact Transcat for all your used equipment needs.

Availability: Ships in 3-4 weeks
This product is available for shipping to the United States, Canada, and Puerto Rico only.
This product is available for shipping to the United States, Canada, and Puerto Rico only.
This product is available for shipping to the United States, Canada, and Puerto Rico only.

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Product Highlights

The 41421B is a Semiconductor Parameter Analyzer from Agilent. Semiconductor parameter analyzers are all-in-one tools used for a wide range of measurement capabilities. Semiconductor parameter analyzers can measure and analyze electrical characterizations of many types of electronic devices, materials, active or passive components, semiconductors, or any other kind of electronic equipment. Engineers use this piece of test equipment for the monitoring of current and voltage responses in different types of devices.

  • Ranges: 100 microvolt to 100V range
  • Current up to 100 mA

The Agilent 41421B Source/Monitor Unit (Medium Power SMU: MPSMU) is a plug-in unit for the 4142B Modular DC Source/Monitor. The 4142B can force and measure up to +/-100 V or +/-100 mA (maximum power: 2 W). The Agilent 41421B pA Meter / DC Voltage Source consists of an extremely stable picoampere meter and two programmable DC voltage sources, one of which operates as a ramp and staircase generator as well as a DC source. These features make the unit ideal for making DC characteristic measurements such as leakage current, current-voltage characteristics and quasi-static C-V measurements required by the semiconductor industry for new product development and for improving production yields. It is equally useful in measurements of electronic components and materials to determine leakage currents or insulation resistances.

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