Used Keithley 4200A-SCS S-Parameter Analyzer System

Product Highlights

Accelerate research, reliability and failure analysis studies of semiconductor devices, materials and process development with the 4200A-SCS. The highest performance parameter analyzer, it delivers synchronizing current-voltage (I-V), capacitance-voltage (C-V) and ultra-fast pulsed I-V measurements.

Parametric insight, fast and clear

Advancing your bold discoveries has never been easier. The 4200A-SCS Parameter Analyzer reduces the time from setup to running characterization tests by up to 50%, allowing uncompromised measurement and analysis capability. Plus, embedded measurement expertise provides unparalleled test guidance and gives supreme confidence in the resulting measurements.

• Advanced measurement hardware for DC I-V, C-V, and pulsed I-V measurement types
• Begin testing immediately with hundreds of user-modifiable application tests included in the Clarius software
• Automated real-time parameter extraction, data graphing, analysis functions

Accurate C-V Characterization

Measure single-digit femtofarads with Keithley's newest capacitance-voltage unit (CVU), the 4215-CVU. By integrating a 1 V AC source into Keithley's industry-leading CVU architecture, the 4215-CVU offers low-noise capacitance measurements at frequencies from 1 kHz to 10 MHz.

• First C-V meter in its class capable of driving a 1 V AC source voltage
• 1 kHz frequency resolution from 1 kHz to 10 MHz
• Measure capacitance, conductance, and admittance
• Measure on up to four channels with the 4200A-CVIV Multiswitch

Measure. Switch. Repeat.

The 4200A-CVIV Multi-Switch automatically switches between I-V and C-V measurements without re-cabling or lifting the prober tips. Unlike competing products, the four-channel 4200A-CVIV display provides local visual insight for quick test setup and easy troubleshooting when unexpected results occur.

• Move C-V measurement to any device terminal without re-cabling
• User-configurable for low current capability
• Personalize the names of output channels
• View real-time test status

Stable low current measurements for I-V Characterization

With the 4201-SMU and 4211-SMU modules you can achieve stable low current measurements in a high capacitance system. With four models of source measure unit (SMU) to choose from, the 4200A-SCS can be customized to meet all of your I-V measurement needs. By offering field Installable Units and optional preamplifier modules, Keithley makes sure that you can make the most accurate low current measurements with little to no downtime.

• Add an SMU without sending the instrument back to the factory
• Make femptoamp measurements
• Up to 9 SMU channels
• Optimized for long cables or large chucks

Integrated solution with analytical probers and cryogenic controllers

The 4200A-SCS Parameter Analyzer supports many manual and semi-automated wafer probers and cryogenic temperature controllers, including MPI, Cascade MicroTech, Lucas Labs/Signatone, MicroManipulator, Wentworth Laboratories, LakeShore Model 336 cryogenic temperature controller.

• "Point and click" test sequencing
• "Manual" prober mode tests prober functionality
• Fake prober mode enables debugging without removing commands

Cut Costs and Protect Your Investment

Keithley Care plans provide fast, high-quality services at a fraction of the cost of on-demand service events. You are one click or phone call away from obtaining repair coverage - no quotes, purchase orders, or approval delays.