The Keysight B2901C is a high-performance, single-channel precision Source/Measure Unit (SMU) offering accurate and versatile voltage and current sourcing and measurement capabilities. It supports voltages up to ±210 V, currents up to ±3 A DC, and pulsed currents up to ±10.5 A, making the it ideal for diverse IV measurement tasks. Its fine resolution (100 fA current measurement, 1 µV voltage sourcing) allows precise characterization of semiconductors, discrete components, photovoltaic cells, and other electronic devices, previously achievable only with specialized equipment.
The integrated four-quadrant functionality simplifies complex measurement setups, replacing multiple instruments with one compact unit. A built-in Arbitrary Waveform Generator and various sweep functions (linear, logarithmic, pulsed) enable flexible characterization under dynamic electrical conditions. The 4-wire Kelvin connection ensures accurate low-resistance measurements by eliminating lead resistance errors. Additionally, the B2901C 's high-capacitance measurement mode supports stable testing of devices with capacitive loads up to 50 µF, addressing typical oscillation challenges.
A 4.3-inch color LCD graphical interface allows intuitive setup, data viewing, and real-time interactive testing directly from the front panel. Remote control via USB, LAN, GPIB, and available software solutions like Keysight's PathWave BenchVue and EasyEXPERT group+ facilitate seamless integration into automated test environments, improving efficiency and productivity. Rapid sampling rates (up to 50,000 points/second) and advanced trigger options provide precise timing control, ideal for capturing low-frequency transient phenomena. Compact, reliable, and user-friendly, the B2901C significantly enhances testing accuracy and throughput in both laboratory and production environments.
- Number of Channels: 1
- Max Voltage: 210 V
- Output Range Max Current (DC): 3A
- Output Range Max Current (pulse): 10.5A
- Measurement Resolution: 6.5 digit
- View Modes: Single and Graph
- Limit Test, Fast Transient Mode and Easy File Access
Applications
- Semiconductor Device Characterization
- Research & Development Laboratories
- Test & Measurement in Production /Automated Test Setups
- Green Energy / Power-Electronics Device Testing
- Materials & Device Research
- Pulse Testing / Transient Analysis
Each Unit Includes
- B2901C Source Measure Unit
- Power cable
- USB cable
- Quick Reference (English)
