Keithley 595 Highlights
The Keithley 595 Quasistatic C-V Meter measures quasistatic capacitance versus voltage (C-V) characteristics of Metal Insulator Semiconductor (MIS) semiconductor devices.The C-V measurement technique used by the Keithley 595 provides diagnostics and correction for common sources off errors to increase confidence in the test results.
- Measures quasistatic capacitance (10fF-20nF) and DC current (1fA-200_A)
- Correction of capacitance readings for background leakage currents
- Rapid assurance of device equilibrium
- Superior signal-to-noise performance,even with the slow voltage sweeps required by today`s state-of-the-art devices